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| Project Number: |
Title |
Initiation Date |
Committee |
Reserved Final Publication Number: |
| PN-5192 |
THICK FILM RESISTOR SPECIFICATION |
06/16/2009 |
P-1 |
EIA-575 B |
| PN-5191 |
DETAIL SPECIFICATION FOR MINI MULTILANE SHIELDED INTEGRATED CONNECTOR |
06/11/2009 |
CE-2.0 |
EIA-965 |
| PN-5190 |
DETAIL SPECIFICATION FOR QSFP+ COPPER AND OPTICAL MODULES |
06/11/2009 |
CE-2.0 |
EIA-964 |
| PN-5189 |
FIREWALL FLAME TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
06/04/2009 |
CE-2.0 |
EIA-364-45B |
| PN-5188 |
LOW FREQUENCY SHIELDING EFFECTIVENESS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
06/03/2009 |
CE-2.0 |
EIA-364-80A |
| PN-5187 |
RESIDUAL MAGNETISM TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
06/02/2009 |
CE-2.0 |
EIA-364-88A |
| PN-5186 |
TEST PROCEDURES FOR ELECTRICAL CONNECTORS |
06/02/2009 |
CE-2.0 |
EIA-364-51 |
| PN-5183 |
ENVIRONMENTAL TEST METHODOLOGY FOR ASSESSING THE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETS USED IN CONTROLLED ENVIRONMENT APPLICATIONS |
11/09/2008 |
CE-2.0 |
EIA-364-1000.01B |
| PN-5182 |
FIXED FILM DIELECTRIC CAPACITORS, STACKED METALLIZED CHIP CAPACITORS |
11/05/2008 |
P-2.2 |
TBD |
| PN-5181 |
NANOSECOND EVENT DETECTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS |
09/26/2008 |
CE-2.0 |
EIA-364-87A |
| PN-5180 |
CABLE FLEXING TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
09/26/2008 |
CE-2.0 |
EIA-364-41E |
| PN-5179 |
EFFECTIVE RESISTANCE OF PARALLEL CIRCUITS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
07/30/2008 |
CE-2.0 |
EIA-364-112 |
| PN-5178 |
LEAD TAPING OF COMPONENTS IN THE RADIAL CONFIGURATION FOR AUTOMATIC HANDLING |
05/15/2008 |
ACH |
EIA/ECA-468-C |
| PN-5177 |
ALTITUDE IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
05/01/2008 |
CE-2.0 |
EIA-364-03C |
| PN-5176 |
TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS |
04/28/2008 |
CE-2.0 |
EIA-364-04A |
| PN-5175 |
LIGHTNING STRIKE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
04/14/2008 |
CE-2.0 |
EIA-364-75 |
| PN-5171 |
ELECTRICAL CONNECTOR / SOCKET TEST PROCEDURES INCLUDING ENVIRONMENTAL CLASSIFICATIONS |
06/21/2007 |
CE-2.0 |
EIA-364E |
| PN-5170 |
CABLE FLEXING TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
06/18/2007 |
CE-2.0 |
EIA-364-41D |
| PN-5169 |
CABLE PULL-OUT TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
06/18/2007 |
CE-2.0 |
EIA-364-38C |
| PN-5168 |
THERMAL SHOCK (Temperature Cycling) TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
06/18/2007 |
CE-2.0 |
EIA-364-32E |
| PN-5167 |
TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS |
06/07/2007 |
CE-2.0 |
EIA-364-19 |
| PN-5166 |
FLUID IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
05/14/2007 |
CE-2.0 |
EIA-364-10E |
| PN-5165 |
CHINA RoHS ENVIRONMENTAL FRIENDLY USE PERIOD (EFUP) MARKING REQUIREMENTS |
05/23/2007 |
S-1 |
CB-24 |
| PN-5164 |
TEST PROCEDURE FOR DETERMINING THE TOTAL IONIC CONTAMINATION OF AN ELECTRICAL CONNECTOR OR SOCKET ASSEMBLY OR COMPONENT |
04/06/2007 |
CE-2.0 |
EIA-364-111 |
| PN-5163 |
ALTITUDE - LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
03/23/2007 |
CE-2.0 |
EIA-364-105A |
| PN-5162 |
CONTACT AXIAL CONCENTRICITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
01/19/2007 |
CE-2.0 |
EIA-364-07C |
| PN-5161 |
INSULATION RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS, SOCKETS, AND COAXIAL CONTACTS |
01/19/2007 |
CE-2.0 |
EIA-364-21D |
| PN-5160 |
WITHSTANDING VOLTAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS, SOCKETS, AND COAXIAL CONTACTS |
01/19/2007 |
CE-2.0 |
EIA-364-20D |
| PN-5159 |
MATERIAL COMPOSITION DECLARATION FOR ELECTRONIC PRODUCTS |
01/05/2007 |
EIA/EIC JIG |
JIG-101A |
| PN-5158 |
RESISTANCE TO SOLDERING HEAT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
11/30/2006 |
CE-2.0 |
EIA-364-56D |
| PN-5157 |
MATING AND UNMATING FORCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
11/30/2006 |
CE-2.0 |
EIA-364-13D |
| PN-5156 |
TEMPERATURE LIFE WITH OR WITHOUT ELECTRICAL LOAD TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
11/03/2006 |
CE-2.0 |
EIA-364-17C |
| PN-5155 |
AXIAL-LEADED, GLASS ENCAPSULATED CAPACITORS |
10/25/2006 |
P-2.1 |
EIA 198 Part III Section 7 |
| PN-5154 |
AXIAL-LEADED CAPACITORS, CONFORMALLY COATED AND MOLDED TYPES |
10/25/2006 |
P-2.1 |
EIA 198 Part III Section 6 |
| PN-5153 |
RADIAL-LEADED CAPACITORS, COMFORMALLY COATED AND MOLDED TYPES |
10/25/2006 |
P-2.1 |
EIA 198 Part III Section 4 |
| PN-5152 |
RADIAL-LEADED, MOLDED CAPACITORS |
10/25/2006 |
P-2.1 |
EIA-198 Part III Section 5 |
| PN-5151 |
HIGH VOLTAGE MULTILAYER CAPACITORS |
10/25/2006 |
P-2.1 |
EIA 198 Part III Section 9 |
| PN-5150 |
HUMIDITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
09/09/2006 |
CE-2.0 |
EIA-364-31C |
| PN-5149 |
ASSEMBLY PROCESSING, EVALUATION AND CLASSIFICATION OF Non-IC ELECTRONIC COMPONENTS |
09/26/2006 |
S-1 |
TBD |
| PN-5143 |
ENVIRONMENTAL TEST METHODOLOGY FOR ASSESSING THE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETS USED IN CONTROLLED ENVIRONMENT APPLICATIONS |
06/20/2006 |
CE-2.0 |
EIA-364-1000 |
| PN-5142 |
TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS |
06/09/2006 |
CE-2.0 |
TBD |
| PN-5141 |
SOLDERABLILTY TESTS FOR COMPONENT LEADS, TERMINATION, LUGS, TERMINALS AND WIRES |
05/19/2006 |
STC |
J-STD-002C |
| PN-5138 |
SOLID TANTALUM CAPACITOR IN MICROMINI CASES |
05/10/2006 |
P-2.5 |
TBD |
| PN-5137 |
SOLID TANTALUM CAPACITOR MOLDED CASE WITH FACEDOWN TERMINATIONS |
05/10/2006 |
P-2.5 |
TBD |
| PN-5136 |
MATING AND UNMATING FORCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
01/26/2006 |
CE-2.0 |
EIA-364-13C |
| PN-5135 |
CAPACITOR STANDARD FOR IC ENGINE CRANKING |
02/07/2006 |
KFI |
TBD |
| PN-5134 |
THERMAL SHOCK (Temperature Cycling) TEST PROCDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
01/23/2006 |
CE-2.0 |
EIA-364-32D |
| PN-5133 |
ENVIRONMENTAL ACCEPTANCE REQUIREMENTS FOR WHISKER SUSCEPTIBILITY OF Pb-FREE ALLOY SURFACE FINISHES |
01/19/2006 |
S-1 |
EIA/ECA CB23 |
| PN-5130 |
MECHANICALLY-INTERLOCKED COMPONENT PACKAGING FOR AUTOMATIC HANDLING |
01/18/2006 |
ACH |
EIA-704-A |
| PN-5129 |
BARE DIE AND CHIP SCALE PACKAGES TAPED IN 8mm & 12mm CARRIER TAPE FOR AUTOMATIC HANDLING |
01/18/2006 |
ACH |
EIA-763-A |
| PN-5128 |
8mm PUNCHED & EMBOSSED CARRIER TAPING OF SURFACE MOUNT COMPONENTS FOR AUTOMATIC HANDILING OF DEVICES GENERALLY SMALLER THAN 20.mm x 1.2 mm |
01/18/2006 |
ACH |
EIA-726-A |
| PN-5127 |
WIRE BENDING TEST PROCEDURE FOR INSULATION DISPLACEMENT CONTACTS (IDC) FOR ELECTRICAL CONNECTORS |
12/13/2005 |
CE-2.0 |
EIA-364-92 |
| PN-5126 |
POLARIZING/CODING KEY OVERSTRESS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
12/13/2005 |
CE-2.0 |
EIA-364-86 |
| PN-5125 |
VIBRATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
11/10/2005 |
CE-2.0 |
EIA-364-28E |
| PN-5124 |
RESISTANCE TO SOLDERING HEAT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
11/29/2005 |
CE-2.0 |
EIA-364-56C |
PN-5123
CANCELLED |
Ball Grid Array (BGA) and Land Grid Array (LGA) Test Sequence for Electrical Connectors and Sockets |
10/10/2005 |
CE-2.0 |
EIA-364-1003 |
| PN-5122 |
INTEGRATED PASSIVE DEVICE PRODUCT REGISTRATIONS EIA-850 |
10/25/2005 |
P-10 |
EIA-850-A |
| PN-5121 |
INTEGRATED PASSIVE DEVICE (IPD) CHIPSCALE PACKAGE DESIGN GUIDELINES EIA-800 |
10/25/2005 |
P-10 |
EIA-800-A |
| PN-5120 |
IPD APPLICATION GUIDELINE |
10/13/2005 |
P-10 |
EIA/ECA 957-A |
| PN-5119 |
ARCHIVE THE FOLLOWING STANDARDS: EIA-172-B, EIA-460, EIA-196-A, EIA-396, EIA-451, EIA-452 |
9/21/2005 |
P-1 |
N/A |
| PN-5118 |
COMMENTS ON TEST METHODS AND CRITERIA FOR TIN WHISKERS IN SURFACE MOUNT PASSIVE DEVICES |
9/21/2005 |
S-1 |
CB-22 |
| PN-5117 |
CORRECTION TO EIA 481 |
9/21/2005 |
S-1 |
CB-20 |
| PN-5116 |
ECA GUIDELINE: COUNTERFEIT PASSIVE COMPONENTS |
9/21/2005 |
S-1 |
CB-21 |
| PN-5115 |
HAVE YOU SEEN TIN WHISKERS? THE FACTS ABOUT TIN WHISKERS |
9/21/2005 |
S-1 |
CB-19A |
| PN-5114 |
ELECTRICAL SOCKET SPECIFICATIONS |
7/7/2005 |
CE-2.0 |
EIA-540C000, 540CA00, 540CAAA, 540CAAB |
| PN-5113 |
LIGHTNING STRIKE TEST FOR ELECTRICAL CONNECTORS |
7/24/2005 |
CE-2.0 |
EIA-364-75 |
| PN-5112 |
ELECTRICAL SOCKET SPECIFICATIONS |
7/13/2005 |
CE-2.0 |
|
| PN-5111 |
LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
7/01/2005 |
CE-2.0 |
EIA-364-59A |
| PN-5110 |
CONTACT STRENGTH TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
7/01/2005 |
CE-2.0 |
EIA-364-15A |
| PN-5109 |
VISUAL AND DIMENSIONAL INSPECTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
7/01/2005 |
CE-2.0 |
EIA-364-18B |
| PN-5106 |
CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
6/11/2005 |
CE-2.0 |
EIA-364-06C |
| PN-5105 |
LOW LEVEL CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
6/11/2005 |
CE-2.0 |
EIA-364-23C |
| PN-5104 |
SURFACE MOUNT COMMAND MODE CHOKE |
6/2/2005 |
P-3 |
EIA-958 |
| PN-5103 |
FLUID IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
5/31/2005 |
CE-2.0 |
EIA-36410D |
| PN-5100 |
VISUAL AND MECHANICAL INSPECTION FOR MOLDED SOLID TANTALUM CHIP CAPACITORS |
5/18/2005 |
P-2.5 |
EIA-757-A |
| PN-5099 |
SMD MULTILAYER CERAMIC CHIP CAPACITORS |
N/A |
P-2.1 |
EIA-198-E III/3 |
| PN-5098 |
SOLID TANTALUM CAPACITOR APPLICATION GUIDELINE |
5/18/2005 |
P-2.5 |
EIA-809A |
| PN-5097 |
SURFACE MOUNT TANTALUM CAPACITOR QUALIFICATION SPECIFICATION |
5/18/2005 |
P-2.5 |
EIA-717 |
| PN-5095 |
ANSI/EIA 521: APPLICATION GUIDE FOR MULTILAYER CERAMIC CAPACITORS - ELECTRICAL |
N/A |
P-2.1 |
ANSI/EIA - 521 |
| PN-5094 |
VISUAL AND MECHANICAL INSPECTION MULTILAYER CERAMIC CHIP CAPACITORS |
5/16/2005 |
P-2.1 |
EIA-595 A |
| PN-5093 |
NEW STANDARD THIN FILM ON SILICON RESISTOR NETWORK SPECIFICATION |
5/12/2005 |
P-1 |
TBA |
| PN-5092 |
REVISION ON EIA/IS-703 |
5/12/2005 |
P-1 |
EIA-703-A |
| PN-5091 |
REVISION ON EIA-887 |
5/12/2005 |
P-1 |
TBA |
| PN-5090 |
REVISION ON EIA-886 |
5/12/2005 |
P-1 |
TBA |
| PN-5089 |
CURRENT CYCLING TEST FOR ELECTRICAL CONNECTORS |
4/20/2005 |
CE-20 |
EIA/ECA-364-55A |
| PN-5088 |
ASSEMBLY COMPONENT TRAY-ACT |
8/13/2004 |
ACH |
EIA-960 |
| PN-5087 |
ELECTRICAL AND ELECTRONIC COMPONENT HAZARDOUS SUBSTANCE FREE STANDARD AND REQUIREMENTS |
3/7/2005 |
ECCB |
EIA/ECCB-954 |
| PN-5086 |
REVISION OF EIA-364-89A |
3/3/2005 |
CE-2.0 |
TBA |
| PN-5085 |
REVISION OF EIA-364-46B |
3/3/2005 |
CE-2.0 |
EIA-364-46C |
| PN-5084 |
REVISION OF EIA-364-36B |
3/3/2005 |
CE-2.0 |
EIA-364-36C |
| PN-5083 |
REAFFIRMATION OF 17 364 TP's |
2/20/2005 |
CE-2.0 |
TBA |
| PN-5082 |
TRAY STANDARD |
10/13/2004 |
ACH |
TBA |
| PN-5081 |
NON-CONVENTIONAL SMALL PITCH & WIDTH |
10/13/2004 |
ACH |
TBA |
| PN-5080 |
WAVE AND CAMBER |
10/13/2004 |
ACH |
TBA |
| PN-5079 |
NIOBIUM CAPS |
10/13/2004 |
P-2.5 |
TBA |
| PN-5078 |
UPGRADE IS-717 |
10/13/2004 |
P-2.5 |
EIA-717 |
| PN-5077 |
REVISION OF EIA-809 |
10/13/2004 |
P-2.5 |
EIA-809-A |
| PN-5076 |
COMBINE EIA-535BAAC & EIA-535BAAE |
10/13/2004 |
P-2.5 |
TBA |
| PN-5075 |
NIOBIUN CAPS |
10/13/2004 |
P-14 |
TBA |
PN-5074
|
USER'S APPLICATION GUIDE TO FUSES |
10/28/2004
|
P-14
|
TBA
|
PN-5073
|
LOW VOLTAGE SUPPLEMENTAL FUSE QUALIFICATION SPECIFICATION
|
10/28/2004
|
P-14
|
TBA
|
PN-5072
|
SURGE WITHSTAND TELECOMMUNICATIONS FUSE QUALIFICATION SPECIFICATION
|
10/28/2004
|
P-14
|
TBA
|
| PN-5071 |
METALLIC COATING THICKNESS MEASUREMENT OF CONTACTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
8/27/2004 |
ECA CE-2.0 |
EIA-364-48A |
| PN-5070 |
ENGINEERING SPECIFICATION FOR CACUUM GRADE MONEL ALLOY 404 (UNS N40400) FOR VACUUM ELECTRON DEVICES |
8/17/2004 |
ECA MVED |
EIA/ECA-951 |
| PN-5069 |
ENGINEERING SPECIFICATION FOR VACUUM GRADE 70 COPPER 3 NICKEL ALLOY OF VACUUM ELECTRON DEVICES |
8/17/2004 |
ECA MVED |
EIA/ECA-950 |
| PN-5068 |
ENGINEERING SPECIFICATION FOR METALLIZED BERYLLIUM OXIDE CERAMICS |
8/17/2004 |
ECA MVED |
EIA/ECA-949 |
| PN-5067 |
STANDARD FOR PLANS TO DETERMINE LEAD CONTENT OF ELECTRONIC COMPONENTS AND RELATED EQUIPMENT |
8/13/2004
Published SEP 2004 |
ECCB TPC-1 |
EIA/ECCB-952 |
| PN-5065 |
RESISTANCE TO SOLVENTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
8/4/2004 |
ECA CE-2.0 |
EIA-364-11B |
| PN-5047 |
MATERIALS COMPOSITION DECLARATION GUIDE |
1/23/2003 |
EIA MDG-1 |
TBA |
| PN-4996 |
QUALIFICATION SPECIFICATION FOR DIE LEVEL NETWORKS WITH SOLDER BUMP INTERCONNECTS |
1/02/2002 |
P-10 |
EIA-961 |
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