P-9 Test Methods and Procedures

Next Meeting: October 6-9, 2008 Salt Lake City, UT

Meeting Date	Notice	Agenda	Roster	Minutes	Attachments
October 7, 2002	10/07	10/07	10/07	10/07	DSCC (PDF)
April 15, 2002	04/15	04/15	04/15	04/15	—
October 10, 2001	10/10	10/10	10/09	10/09	—
April 25, 2001	04/25	04/25	04/25	04/25	DSCC (PDF)
October 4, 2000	10/04(PDF)	10/04	10/04	10/04	—
April 5, 2000	—	—	—	04/05	—

Committee Scope: Engineering matters pertaining to all types of environmental, electronic, mechanical, process and material test methods used on a variety of passive and electromechanical parts or materials; the appropriate committee or subcommittee will handle test methods concerned with a single part or family of components.

Committee Chairman:

Roster:

Member

Distribution List

Michael Amoroso AMCO Engineering Company Edward Aoki Agilent Technologies William Ebling Vishay Intertechnology, Inc. Richard Groft Tyco Electronics/AMP James Howard Vishay Intertechnology, Inc. John Kikta Patrick Kyne Defense Supply Center Columbus Michael Lauri IBM Corporation Laird Macomber Cornell Dubilier Brian Piscitelli KOA Speer Electronics, Inc. Christine Pollock Presidio Components, Inc. Chris Reynolds AVX Corporation David Richardson Vishay Intertechnology, Inc. Felix Santilli Mini-Systems Inc. Mary Sprankle LOCKHEED MARTIN FEDERAL SYSTEMS Jayson Young Kemet Electronics

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