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Minutes of JT-31 Optical Characteristics
May 22, 2002
The Boston Park Plaza Hotel

1 Committee organization and procedures

1.1 Membership and attendance
1.1 Welcome by George Ehemann and self- introduction of all members. Attendance was taken, and it was determined that a quorum was present. The group felt that Philips and Toshiba should be participants in the work of this committee. Mr. Rowe also mentioned that the IEC PDP (Plasma Display Panels) is meeting tomorrow. He will see if there is any interest in members there participating in JT-31.

1.2 Agenda approved.
With the addition of one item, the agenda was approved. Under new business, add the topic of revision of IEC 441.

1.3 Approval of JT-31 Minutes
Minutes from 06 June 2001 meeting held in San Jose, CA were approved with editorial change noted: Item 3.1 change GATech to GA Tech.. Minutes were approved unanimously.

1.4 Correspondences
The Chair had sent out prior to the meeting a document discussing a Test Method for Display Surface Diffuse Reflectance and Haze.

2.0 Old Business
2.1 Status of the new electronic template for phosphor registration
The registration system on the ECA website is posted. Bill Rowe volunteered to go to the site and download the template for phosphor registration to check it out. Also note was made to change the contact at ECA. It incorrectly refers to Bernie Aronson as staff contact.

2.2 TEP-105-15, Glass Aging
The document was reviewed and discussed. One comment was that there is not much concern about aging anymore due to present technology, but the content is still used in certain applications. The document will be updated by consideration of adding a curve diagram to the document. George Ehemann volunteered to take this as an action item. It was also agreed that some Terms and Definitions should be added. Frank Schwab volunteered to prepare this proposed addition. Since the document is presently all text and not available on disk, due to its age, EIA staff will prepare the electronic text. The plan is to then integrate the new parts and circulate the document to the committee for a letter ballot.

3.0 New Business
3.1 TEP-105-12 Test Method for Tube Face Reflectance
This document requires updating. Ed Kelley led the discussion by highlighting parts of his paper delivered at SID this week. He stated that information is available through the NIST website to the ftp site. http://www.fpd.nist.gov or http://www.fpdl.nist.gov . His paper; "Sensitivity of Display Reflectance to Apparatus Geometry" and a course on the subject is available. Discussion covered measuring and identifying haze, specular and diffuse components.

George Ehemann discussed an approach suggesting that without resorting to a full measurement of the BRDF (bivariant reflectance distribution function), optical characterization of display surfaces could be approximated from conducting simpler measurements of Spatial response to a step intensity signal, Amplitude modulation from a resolution chart, and Background level of diffuse reflectance. These three measurements purport to approximate the haze, specular reflectance and diffuse reflectance respectively.

It is apparent that it is not desirable to have to measure BRDF. An approach being looked at by NIST explores the possible use of a CCD Camera with 300MM lens and use of a variable radius source. From this apparatus, it is believed that one can obtain the haze peak and specular component from the data. This is a likely method to be developed.

NIST plans to conduct a round robin to measure the subject. The committee wishes to be placed on the list for the round robin.

3.2 There has been no major activity in Phosphor Registration in the last few years. TEPAC 116-C is the Document. The industry is now working on particle size. A good update on the 116-C would be to make it a searchable CD. It is still felt that this document has useful content derived from efficient test procedures for persistence and linearity.

3.3 The suggestion was made to consider the committee get involved with an ISO activity dealing with their 9241 Series regarding CRT monitors and the 13406-2 document for FPDs. The entire document needs to be rewritten. Ed Kelley says to contact Paul Boynton at NIST for more information on this activity. Paul.Boynton@nist.gov . The Chair will follow up on this.

3.4 IEC 441 update project
Bill Rowe will send a copy of the document to George Ehemann for consideration of what topics to address.

4.0 Future Business Meetings
4.1 The committee agreed to attempt to set up the next meeting at NIST in conjunction with a tour there. The approximate timeframe will be in late September 2002. Ed Mikoski will get in contact with the Chair to finalize the details. A mid-week day for the meeting would be desirable.
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5.0 Meeting adjourned at approximately 11:00am.

This meeting was conducted in accordance with the EIA Legal Guidelines and the Manual of Organization and Procedures.

George Ehemann , Chairperson

Ed Mikoski , Secretary

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