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Home > Technology Center > Engineering Committees > P-2.1 Committee Minutes
of P-2.1 Committee on Ceramic Dielectric Capacitors
1.0
Committee Organization and Procedures Self-introductions
were made, and the roster and sign-in sheets were circulated. The Committee was reminded of the Committee membership rule, which states that if a member misses two consecutive meetings, then at the third missed meeting, the member is moved from the membership list to the non-voting CTA list. The member will be re-instated at the next meeting attended. This rule comes from EIA EP-20-A, "Manual of Organization & Procedure," December 2000, Section 4.6.1.1 Meeting Quorum Pool (page 17-18), which states that: - A meeting quorum pool is defined as those members eligible to vote at a meeting: a) If a voting member is not represented at two consecutive meetings and the absence continues for the subsequent meetings, the member shall be removed from the Meeting Quorum Poll for the subsequent meetings. Upon attendance at a subsequent meeting the member shall be reinstated in the Meeting Quorum Poll and have full voting privileges at that meeting. 1.2 Approval of Fall Meeting Minutes from San Diego The Committee unanimously
accepted the Minutes of the last meeting as written. A list of active
P-2.1 Committee projects will be attached to the minutes. Action Item
1.4 Correspondence & Review of Committee's scope. Take the word "and"
from P-2.1 Committee on Ceramic and Dielectric Capacitors 1.5.1 DSCC DSCC report given by Ken Bernier. The report will be attached to the minutes and posted on the ECA web site. Action Item 1.5.2 ACH & U-1 Committees See ACH & U-1 minutes posted on the ECA web site. 1.5.3 Working Group Report Discussed adding
4 volt rating to EIA-198 2.0 Old Business 2.1 Status of EIA-595-A (SP-4622), "Visual & Mechanical Inspection Multilayer Ceramic Chip Capacitors," ANSI Ballot Results (Voting period closed 4/2/2001) - Dick Thompson Dick Thompson led a review of the EIA 595-A Visual-Mechanical Guide which was recently sent out for ANSI ballot. The committee dealt with comments from Mr. Garcia. Mr. Thompson will respond to Mr. Garcia and will address all his comments with the concurrence of the committee. Motion: - To approve
and publish SP-4622 as EIA/ANSI-595-A once Mr. Garcia's comments are
addressed. 2.2 Status Revision of EIA-469-D (PN-4621), "Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors," The committee had previously voted to ballot a clean copy at the 10/99 meeting. Christine Pollack had a copy and did a final review of the document and the photos, and forwarded it to Michael Tinkleman, EIA to be balloted. Subsequent editorial comments were received from Michael Griffith. Michael Tinkleman will review editorial comments and prepare a copy of PN-4621 to be put out on a 60-day SP ballot (SP-4621) for ANSI public review. Action Item 2.3 EIA 198-F Update, "Ceramic Dielectric Capacitors Classes I, II, III, & IV," All comments on the working draft have been resolved. PN number needs to be assigned. Mike Lauri will send the final version to Michael Tinkleman Action Items Motion: - To ballot
EIA-198-F, Part I, "Characteristics and Requirements" on a
60-day SP ballot for ANSI public review. This document was addressed in the working group. Mil Std 202 is being revised currently. Comments from DSCC will be attached to these minutes for information purposes and will be presented at the P-9 committee meeting. Motion: - To ballot
EIA-198-F, Part II: Test Methods (SP-4946), once comments are addressed,
on a 60-day SP ballot for ANSI public review. - Part III: Individual Specifications. 4 Project Numbers
are needed for part III - Leaded, High voltage SMD, Low Inductance SMD
and Standard Voltage SMD (slash 3). Michael Tinkleman will have PN's
issued. Action Item 2.4 Review of IEC/EIA 521, "Application Guide for Multilayer Ceramic Capacitors - Electrical," changes for temperature-voltage coefficient - Dick Thompson Dick Thompson is working IEC/EIA-521 and expects to have an electronic copy ready for discussion at the next meeting. 2.5 Status of
chip dimension tolerance for Bulk Case 2.6 Status of Low ESL test method. Still being worked on. Need to appoint a subcommittee of P2.1 to develop/recommend standards for RF current and measurement specifications. To be discussed at the next meeting's working group meeting. 4.0 Next Meeting The next meeting will be at the 3rd Engineering Summit 10/8-10/2001 in Philadelphia at the Loews Hotel. 5.0 Adjournment The Committee moved, seconded, and unanimously agreed to adjourn at 12:05 PM. 6.0 Action Items A list of active
P-2.1 Committee projects will be attached to the minutes. EIA-469-D (PN-4621), "Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors," - EIA to circulate a 60-day SP ballot (SP-4621) for ANSI public review. EIA 198-F Update, "Ceramic Dielectric Capacitors Classes I, II, III, & IV," - Part I: Characteristics
and Requirements Update - Mike Lauri - Part II: Test
Methods (SP-4946) - - Part III: Individual
Specifications.
Dave Richardson
/ Michael Tinkleman, Secretary
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